- Field ion microscope (FIM) The field ion microscope allows the imaging of a tip-shaped probe surface on a detector screen at atomic resolution. To accomplish this, a positive voltage is applied to a needle shaped sample in the presence of a residual pressure of a noble gas (He, Ne, Ar ā¦) in high vacuum.www.gmp.tf.fau.de/equipment/microscopy-and-analysis/fim/
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The field-ion microscope (FIM) was invented by Müller in 1951. It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. On October 11, 1955, Erwin Müller and his Ph.D. student, Kanwar Bahadur (Pennsylvania State University) observed ā¦ Visualizza altro
In FIM, a sharp (<50 nm tip radius) metal tip is produced and placed in an ultra high vacuum chamber, which is backfilled with an imaging gas such as helium or neon. The tip is cooled to cryogenic temperatures ā¦ Visualizza altro
ā¢ Müller, E.; Bahadur, K. (1956). "Field Ionization of Gases at a Metal Surface and the Resolution of the Field Ion Microscope". Physical Review. 102 (3): 624. Visualizza altro
FIM like field-emission microscopy (FEM) consists of a sharp sample tip and a fluorescent screen (now replaced by a multichannel plate) ā¦ Visualizza altro
ā¢ Northwestern University Center for Atom-Probe Tomography
ā¢ Photograph of tungsten needle tip imaged through FIM at the Wayback Machine (archived November 22, 2013) Visualizza altroTesto di Wikipedia sotto licenza CC-BY-SA Role of Simulations and Experiments in Analytical Field Ion ā¦
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